Hitachi s-3000n manual

SCANNING ELECTRON MICROSCOPE. (User’s Operation/Maintenance Edition) Please read through this manual carefully. before using the instrument. • Before using the instrument, read the safety. instructions and precautions carefully. • Keep this manual in a safe place nearby so it. can be referred to whenever needed. Used HITACHI SN (SCANNING ELECTRON MICROSCOPES) for sale. CAE has broad access to semiconductor related equipment direct from fabs, often unavailable through other sources. CAE finds the best deals on used HITACHI SN. CAE has 19 scanning electron microscopes currently available. We’re accountable for every transaction — CAE will Brand: HITACHI. Hitachi SN Variable Pressure Scanning Electron Microscope Location: Medical Sciences Building, E-5G Description The Hitachi SN is a Variable Pressure SEM with a tungsten electron source. It was installed in It is capable of imaging specimens at high vacuum and also in a variable pressure range from Pa. This allows non-.

Simple Manual for conventional SEM. HITACHI SN Scanning Electron Microscope(SEM) 22/Jun./ Hisashi Hirata. 31/May/ Toshihiro Hayakawa. S. tart up. analyzer. Power activation. Hitachi High-Tech's scanning electron microscopes SU/SU deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance. The SU is equipped with a large multipurpose specimen chamber to accommodate observation of large samples. See more details. APPLICATION • The S SEM utilizes electron beam accelerated at V to 30 kV. The instrument is designed mainly for observation and evaluation of specimens prepared for observation using SEM. • Note that Hitachi High-Technologies Corporation will not be responsible for injury or damage caused by usage of the instrument in a manner not.

Hitachi User Manuals. 1 ENGLISH Projector CP-S/X/X Users Manual – Quick Guide Thank you for purchasing this projector. WARNING Before using, read the "User's Manual - Safety Guide" and these manuals to ensure correct usage through understanding. After reading, store them in a safe place for future reference. Hitachi SN scanning electron microscope (SEM) is a PC controlled variable pressure SEM with the ability to switch between the high vacuum and variable pressure modes. It has a high density frame memory of x pixels and an advanced image capture and archiving system. Four quadrant solid state backscatter allows imaging in the compositional, 3D and topographic modes. No. Products Manual Tppe Name Target product model Remarks; SVE S10V: User’s Manual: BASIC MODULES; LQP / LQP / S / LQS / LQS / LQV /.